An iterative approach to test time minimization for parallel hybrid BIST architecture
author
Ubar, Raimund-Johannes
Jenihhin, Maksim
Jervan, Gert
Peng, Z.
statement of authorship
Raimund Ubar, Maksim Jenihhin, Gert Jervan, Zebo Peng
source
5th IEEE Latin-American Test Workshop - LATW 2004 : Cartagena, Colombia, 2004 : digest of papers
location of publication
[S.l.]
publisher
IEEE
year of publication
2004
pages
p. 98-103 : ill
conference name, date
5th IEEE Latin-American Test Workshop, Cartagena, Colombia, March 8-10, 2004
conference location
Cartagena, Colombia
url
https://www.ida.liu.se/labs/eslab/publications/pap/db/latw04.pdf
subject term
infotehnoloogia
testimine
notes
Bibliogr.: 14 ref
language
inglise