compact view print

Investigation of charge carrier lifetime temperature-dependence in 4H-SiC diodes

author
Velmre, Enn
Udal, Andres
statement of authorship
Andres Udal and Enn Velmre
source
Silicon carbide and related materials 2006
location of publication
[S.l.]
publisher
Trans Tech Publications
year of publication
2007
pages
p. 375-378
url
https://www.researchgate.net/publication/250348987_Investigation_of_Charge_Carrier_Lifetime_Temperature-Dependence_in_4H-SiC_Diodes
subject term
dioodid
ränikarbiid
temperatuur
simulatsioon
notes
(Materials Science Forum, ISSN 1662-9752 ; 556/557)
TalTech department
elektroonikainstituut
language
inglise
Udal, A., Velmre, E. Investigation of charge carrier lifetime temperature-dependence in 4H-SiC diodes // Silicon carbide and related materials 2006. [S.l.] : Trans Tech Publications, 2007. p. 375-378. https://www.researchgate.net/publication/250348987_Investigation_of_Charge_Carrier_Lifetime_Temperature-Dependence_in_4H-SiC_Diodes