A scalable technique to identify true critical paths in sequential circuits
author
Ubar, Raimund-Johannes
Kostin, Sergei
Jenihhin, Maksim
Raik, Jaan
statement of authorship
Raimund Ubar, Sergei Kostin, Maksim Jenihhin, Jaan Raik
source
Proceedings 2017 IEEE 20th International Symposium on Design and Diagnotics of Electronic Circuit & Systems(DDECS) : April 19-21, 2017, Dresden, Germany
location of publication
Piscataway
publisher
IEEE
year of publication
2017
pages
p. 152-157 : ill
conference name, date
20th IEEE International Symposium on Design and Diagnostics of Electronic Circuits and Systems, April 19-21, 2017
conference location
Dresden, Germany
url
https://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=7934553
subject term
rikked
testimine
elektronlülitused
subject of form
konverentsikogumikud
keyword
timing-critical path
gate-level analysis
NBTI
ISSN
2473-2117
ISBN
978-1-5386-0471-7
notes
Bibliogr.: 21 ref
TTÜ department
arvutisüsteemide instituut
language
inglise