Comparative analysis of sequential circuit test generation approaches
statement of authorship
J.Raik, A.Krivenko, R.Ubar
location of publication
Tallinn
publisher
year of publication
pages
p. 225-228 : ill
subject term
ISBN
9985-59-462-2
notes
Bibliogr.: 12 ref
language
inglise
Raik, J., Krivenko, A., Ubar, R.-J. Comparative analysis of sequential circuit test generation approaches // BEC 2004 : proceedings of the 9th Biennial Baltic Electronics Conference : October 3-6, 2004, Tallinn, Estonia. Tallinn : Tallinn University of Technology, 2004. p. 225-228 : ill.