Fast fault emulation for synchronous sequential circuits
author
Raik, Jaan
Ellervee, Peeter
Tihhomirov, Valentin
Ubar, Raimund-Johannes
statement of authorship
J. Raik, P. Ellervee, V. Tihhomirov, R. Ubar
source
Proceedings of East–West Design & Test Workshop (EWDTW’04) : Yalta, Alushta, Crimea, Ukraine, September 23-26, 2004
location of publication
[Kharkov]
year of publication
2004
pages
p. 35-40
conference name, date
2nd East–West Design & Test Workshop, September 23-26, 2004
conference location
Yalta, Alushta, Crimea, Ukraine
url
https://citeseerx.ist.psu.edu/document?repid=rep1&type=pdf&doi=a6eb712498a5f23db3f95ad66bada257c21e96f0
subject term
digitaalintegraallülitused
testimine
ISBN
966-659-088-3
language
inglise