A decision diagram based hierarchical test pattern generator
author
Jervan, Gert
Markus, Antti
Raik, Jaan
Ubar, Raimund-Johannes
statement of authorship
G.Jervan, A.Markus, J.Raik, R.Ubar
source
BEC'98 : the 6th Biennial Conference on Electronics and Microsystems Technology, October 7-9, 1998, Tallinn, Estonia : proceedings
location of publication
[Tallinn]
year of publication
1998
pages
p. 159-162: ill
subject term
otsustusdiagrammid
testimine
digitaaltehnika
ISBN
9985-59-081-3
notes
Bibl. 5 ref
language
inglise