Fast identification of true critical paths in sequential circuits
author
Ubar, Raimund-Johannes
Kostin, Sergei
Jenihhin, Maksim
Raik, Jaan
Jürimägi, Lembit
statement of authorship
Raimund Ubar, Sergei Kostin, Maksim Jenihhin, Jaan Raik, Lembit Jürimägi
source
Microelectronics reliability
publisher
Elsevier
journal volume number month
vol. 81
year of publication
2018
pages
p. 252-261 : ill
url
https://doi.org/10.1016/j.microrel.2017.11.027
subject term
elektronlülitused
rikked
testimine
keyword
timing-critical path
gate-level analysis
NBTI
ISSN
0026-2714
notes
Bibliogr.: 24 ref
scientific publication
teaduspublikatsioon
classifier
1.1
Scopus
https://www.scopus.com/sourceid/26717
https://www.scopus.com/record/display.uri?eid=2-s2.0-85041489163&origin=inward&txGid=8f2d9e894f22f2945d867ef5424f7212
WOS
https://jcr.clarivate.com/jcr-jp/journal-profile?journal=MICROELECTRON%20RELIAB&year=2022
https://www.webofscience.com/wos/woscc/full-record/WOS:000425576300030
category (general)
Engineering
Tehnika
Physics and astronomy
Füüsika ja astronoomia
Materials science
Materjaliteadus
category (sub)
Engineering. Safety, risk, reliability and quality
Tehnika. Ohutus, risk, töökindlus ja kvaliteet
Engineering. Electrical and electronic engineering
Tehnika. Elektri- ja elektroonikatehnika
Physics and astronomy. Condensed matter physics
Füüsika ja astronoomia. Kondenseeritud aine füüsika
Materials science. Surfaces, coatings and films
Materjaliteadus. Pinnad, katted ja kiled
Physics and astronomy. Atomic and molecular physics, and optics
Füüsika ja astronoomia. Aatomi- ja molekulaarfüüsika ning optika
Materials science. Electronic, optical and magnetic materials
Materjaliteadus. Elektroonilised, optilised ja magnetilised materjalid
quartile
Q2
TalTech department
arvutisüsteemide instituut
language
inglise
Reserch Group
Centre for trustworthy and efficient computing hardware (TECH)
Centre of dependable computing systems