Multiple stuck-at-fault detection theorem
statement of authorship
Raimund Ubar, Sergei Kostin, Jaan Raik
location of publication
Tallinn
publisher
year of publication
pages
p. 236-241 : ill
conference name, date
IEEE 15th International Symposium on Design and Diagnostics of Electronic Circuits & Systems (DDECS), April 18-20, 2012
conference location
Tallinn
subject term
ISBN
978-1-4673-1185-4
notes
Bibliogr.: 24 ref
language
inglise
Ubar, R., Kostin, S., Raik, J. Multiple stuck-at-fault detection theorem // Proceedings of the 2012 IEEE 15th International Symposium on Design and Diagnostics of Electronic Circuits & Systems (DDECS) : April 18-20, 2012 Tallinn, Estonia. Tallinn : IEEE, 2012. p. 236-241 : ill.