A scalable static test set compaction method for sequential circuits
author
Aleksejev, Igor
Raik, Jaan
Jutman, Artur
Ubar, Raimund-Johannes
statement of authorship
Igor Aleksejev, Jaan Raik, Artur Jutman, Raimund Ubar
source
Proceedings of the 9th IEEE Latin-American Test Workshop : LATW2008 : February 17-20, 2008, Puebla, Mexico
location of publication
[S.l.]
year of publication
2008
pages
p. 87-92 : ill
notes
Bibliogr.: 17 ref