Automatic test generation system for VLSI
author
Jervan, Gert
Markus, Antti
Raik, Jaan
Ubar, Raimund-Johannes
statement of authorship
G. Jervan, A. Markus, J. Raik, R. Ubar
source
Proceedings of the First Electronic Circuits and Systems Conference : Bratislava, Slovakia, September 4-5, 1997
location of publication
[S.l.]
year of publication
1997
pages
p. 255-258
conference name, date
First Electronic Circuits and Systems Conference, September 4-5, 1997
conference location
Bratislava, Slovakia
subject term
VLSI-ahelad
testid
testimine
language
inglise