Measurement of charge carrier lifetime temperature dependence in 4H-SiC power diodes
author
Velmre, Enn
Udal, Andres
statement of authorship
A. Udal, Enn Velmre
source
Abstracts of International Conference on Silicon Carbide and Related Materials : ICSCRM'99 : October 10-15, 1999, Research Triangle Park, North-Carolina, USA
location of publication
[S.l.]
year of publication
1999
pages
paper no 394, 2 p
url
https://www.researchgate.net/publication/240833834_Measurement_of_Charge_Carrier_Lifetime_Temperature-Dependence_in_4H-SiC_Power_Diodes
subject term
dioodid
ränikarbiid
temperatuur
eluiga
mõõtmine
TalTech department
elektroonikainstituut
language
inglise