Impurity interaction with point defects in the Si-SiO2 structures and its influence on the interface properties
statement of authorship
D.Kropman, E.Mellikov, T.Kärner, Ü.Ugaste, T.Laas, I.Heinmaa, A.Medvid
journal volume number month
134
year of publication
pages
p. 222-226 : ill
subject term
ISSN
0921-5107
notes
Bibliogr.: 8 ref
language
inglise
Kropman, D., Mellikov, E., Kärner, T., Ugaste, Ü., Laas, T., Heinmaa, I., Medvid, A.* Impurity interaction with point defects in the Si-SiO2 structures and its influence on the interface properties // Materials science and engineering : B (2006) 134, p. 222-226 : ill.