Internet based test generation and fault simulation
                                            statement of authorship
                                    
                                    
E.Ivask, R.Ubar, J.Raik, A.Schneider
                                                    
                                            
                                            location of publication
                                    
                                    
[S. l.]
                                                    
                                            
                                            year of publication
                                    
                                    
                                
                                            pages
                                    
                                    
p. 57-60 : ill
                                                    
                                            
                                            ISBN
                                    
                                    
963 7175 16 4
                                                    
                                            
                                            notes
                                    
                                    
Bibliogr.: 7 ref
                                                    
                                            
                                            language
                                    
                                    
inglise
                                                    
                                            
                                            subject term
                                    
                                    
                                
                            Ivask, E., Ubar, R.-J., Raik, J., Schneider, A. Internet based test generation and fault simulation // IEEE Design and Diagnostics of Electronic Circuits and Systems - IEEE DDECS 2001 : Fourth International Workshop on IEEE Design and Diagnostics of Electronic Circuits and Systems : Györ, Hungary, April 18-20, 2001. [S. l.], 2001. p. 57-60 : ill.