Machine learning to tackle the challenges of transient and soft errors in complex circuits
author
Lange, Thomas
Balakrishnan, Aneesh
Glorieux, Maximilien
Alexandrescu, Dan
Sterpone, Luca
statement of authorship
Thomas Lange, Aneesh Balakrishnan, Maximilien Glorieux, Dan Alexandrescu, Luca Sterpone
source
2019 IEEE 25th International Symposium on On-Line Testing and Robust System Design (IOLTS), 1-3 July 2019, Greece
location of publication
Danvers
publisher
IEEE
year of publication
2019
pages
p. 7-14 : ill
conference name, date
2019 IEEE 25th International Symposium on On-Line Testing and Robust System Design (IOLTS), 1-3 July 2019
conference location
Rhodes, Greece
url
https://doi.org/10.1109/IOLTS.2019.8854423
subject term
rikked
tehisõpe
vead
innovatsioonid
tõrketaluvus
juhuslikud protsessid
lineaarsed mudelid
keyword
transient faults
single-event effects
fault injection
machine learning
linear least squares
k-NN
CART
ridge regression
support vector regression
ISSN
1942-9401
ISBN
978-1-7281-2490-2
notes
Bibliogr.: 15 ref
TalTech department
arvutisüsteemide instituut
language
inglise
Reserch Group
Centre for trustworthy and efficient computing hardware (TECH)