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Number of records 11
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1

book article

Accelerating transient fault injection campaigns by using Dynamic HDL SlicingBagbaba, Ahmet Cagri; Jenihhin, Maksim; Raik, Jaan; Sauer, Christian2019 IEEE Nordic Circuits and Systems Conference (NORCAS) : NORCHIP and International Symposium of System-on-Chip (SoC), 29-30 October 2019, Helsinki, Finland : proceedings in IEEE Xplore2019 / 7 p. : ill https://doi.org/10.1109/NORCHIP.2019.8906932

book article
Seotud publikatsioonid 1
- Methods to optimize functional safety assessment for automotive integrated circuits = Meetodid autotööstuse kiipide funktsionaalse ohutuse hindamise optimeerimiseks
2

journal article EST / journal article ENG

Automated identification of application-dependent safe faults in automotive systems-on-a-chipsBagbaba, Ahmet Cagri; Augusto da Silva, Felipe; Sonza Reorda, Matteo; Hamdioui, Said; Jenihhin, Maksim; Sauer, ChristianElectronics2022 / art. 319 https://doi.org/10.3390/electronics11030319 Journal metrics at Scopus Article at Scopus Journal metrics at WOS Article at WOS

journal article EST / journal article ENG
Seotud publikatsioonid 1
- Methods to optimize functional safety assessment for automotive integrated circuits = Meetodid autotööstuse kiipide funktsionaalse ohutuse hindamise optimeerimiseks
3

book article

Combining fault analysis technologies for ISO26262 functional safety verificationAugusto da Silva, Felipe; Bagbaba, Ahmet Cagri; Hamdioui, Said; Sauer, Christian2019 IEEE 28th Asian Test Symposium (ATS) : 10–13 December 2019, Kolkata, India : proceedings2019 / p. 129–134 : ill https://doi.org/10.1109/ATS47505.2019.00024

book article
Seotud publikatsioonid 1
- Methods to optimize functional safety assessment for automotive integrated circuits = Meetodid autotööstuse kiipide funktsionaalse ohutuse hindamise optimeerimiseks
4

book article

Determined-safe faults identification : a step towards ISO26262 hardware compliant designsAugusto da Silva, Felipe; Bagbaba, Ahmet Cagri; Sartoni, Sandro; Cantoro, Riccardo; Sonza Reorda, Matteo; Hamdioui, Said; Sauer, Christian2020 25th IEEE European Test Symposium (ETS)2020 / 6 p. : ill https://doi.org/10.1109/ETS48528.2020.9131568

book article
Seotud publikatsioonid 1
- Methods to optimize functional safety assessment for automotive integrated circuits = Meetodid autotööstuse kiipide funktsionaalse ohutuse hindamise optimeerimiseks
5

book article

Efficient fault injection based on dynamic HDL slicing techniqueBagbaba, Ahmet Cagri; Jenihhin, Maksim; Raik, Jaan; Sauer, Christian2019 IEEE 25th International Symposium on On-Line Testing and Robust System Design (IOLTS 2019) : 1-3 July 2019, Greece2019 / p. 52-53 : ill https://doi.org/10.1109/IOLTS.2019.8854419

book article
Seotud publikatsioonid 1
- Methods to optimize functional safety assessment for automotive integrated circuits = Meetodid autotööstuse kiipide funktsionaalse ohutuse hindamise optimeerimiseks
6

journal article EST / journal article ENG

EFIC-ME : a fast emulation based fault injection control and monitoring enhancementAbideen, Zain Ul; Rashid, Muhammad HaroonIEEE Access2020 / p. 207705-207716 https://doi.org/10.1109/ACCESS.2020.3038198 Journal metrics at Scopus Article at Scopus Journal metrics at WOS Article at WOS

journal article EST / journal article ENG
7

book article

Machine learning to tackle the challenges of transient and soft errors in complex circuitsLange, Thomas; Balakrishnan, Aneesh; Glorieux, Maximilien; Alexandrescu, Dan; Sterpone, Luca2019 IEEE 25th International Symposium on On-Line Testing and Robust System Design (IOLTS), 1-3 July 2019, Greece2019 / p. 7-14 : ill https://doi.org/10.1109/IOLTS.2019.8854423

book article
8

book article

On the estimation of complex circuits functional failure rate by machine learning techniquesLange, Thomas; Balakrishnan, Aneesh; Glorieux, Maximilien; Alexandrescu, Dan; Sterpone, Luca49th Annual IEEE/IFIP International Conference on Dependable Systems and Networks - DSN 2019 : Supplemental Volume : proceedings2019 / p. 35-41 : ill https://doi.org/10.1109/DSN-S.2019.00021

book article
Seotud publikatsioonid 1
- A synthetic, hierarchical approach for modelling and managing complex systems' quality and reliability = Sünteetiline, hierarhiline lähenemine keerukate süsteemide kvaliteedi ja töökindluse modelleerimiseks ja haldamiseks
9

book article

Representing gate-level SET faults by multiple SEU faults on RT-levelBagbaba, Ahmet Cagri; Jenihhin, Maksim; Ubar, Raimund-Johannes; Sauer, Christian2020 IEEE 26th International Symposium on On-Line Testing and Robust System Design (IOLTS), 13-15 July 2020 : proceedings2020 / art. 19889351, 6 p. : ill https://doi.org/10.1109/IOLTS50870.2020.9159715

book article
Seotud publikatsioonid 1
- Methods to optimize functional safety assessment for automotive integrated circuits = Meetodid autotööstuse kiipide funktsionaalse ohutuse hindamise optimeerimiseks
10

journal article

SALSy : security-aware layout synthesisEslami, Mohammad; Perez, Tiago Diadami; Pagliarini, Samuel NascimentoarXiv.org2024 / 13 p. : ill https://doi.org/10.48550/arXiv.2308.06201

journal article
Seotud publikatsioonid 1
- On the use of defensive schemes for hardware security = Kaitseskeemid riistvara turvalisuse tagamiseks
11

book article

Use of formal methods for verification and optimization of fault lists in the scope of ISO26262Augusto da Silva, Felipe; Bagbaba, Ahmet Cagri; Hamdioui, Said; Sauer, Christian2018 Design and Verification Conference (DVCON) Europe : [proceedings]2018 / 6 p. : ill https://repository.tudelft.nl/islandora/object/uuid%3Adbd7f22d-0324-45f5-9180-8fe3fc95a9ce

book article
Seotud publikatsioonid 1
- Methods to optimize functional safety assessment for automotive integrated circuits = Meetodid autotööstuse kiipide funktsionaalse ohutuse hindamise optimeerimiseks

Number of records 11, displaying 1 - 11

1. fault injection
2. Fault Injection Simulation
3. fault-injection attack
4. false data injection attack
5. False data injection attack; Machine learning; Matlab; Python; State estimation; Sudden load change
6. fiber-reinforced composites and injection molding
7. Gate Injection Transistor (GIT)
8. gating-aware error injection
9. ghost injection attack
10. injection molding
11. injection of technical water
12. manual hydrodynamic injection
13. reactive power injection
14. zero injection phase
15. asynchronous fault detection
16. automatic fault diagnosis
17. bearing fault diagnosis
18. bi-directional fault monitoring devices
19. conditional fault collapsing
20. control fault models
21. critical path fault tracing
22. cross-layer fault tolerance
23. cross-layered fault management
24. extended fault class
25. fault currents
26. fault analysis
27. fault analysis model
28. fault classification
29. fault classification
30. fault collapsing
31. fault compensation
32. fault coverage
33. fault current and voltage measurements
34. Fault current limite
35. fault current limiter
36. fault detection
37. fault detection and diagnoses
38. fault detection and diagnosis
39. fault diagnosis
40. fault diagnostic
41. fault diagnostic resolution
42. fault diagnostics
43. fault dignosis
44. fault effects
45. fault emulation
46. fault equivalence and dominance
47. fault handling
48. fault handling strategy
49. fault indicator
50. fault Interruption
51. fault localization
52. fault management
53. fault masking
54. fault modeling
55. fault models
56. fault monitoring
57. fault prediction
58. fault protection
59. fault redundancy
60. fault resilience
61. fault ride through
62. Fault ride through enhancement
63. fault signal
64. fault simulastion
65. fault simulation
66. fault simulation with critical path tracing
67. fault tolerance
68. fault tolerant
69. fault tolerant control
70. fault tolerant operation
71. fault tolerant router design
72. fault tolerant systems
73. Fault Tree Analysis
74. fault-plane solution
75. fault-resilience
76. fault-resistant
77. fault-ride-through (FRT)
78. fault-tolerance
79. fault-tolerant
80. Fault-tolerant (FT) converters
81. fault-tolerant control
82. fault-tolerant converter
83. functional fault model
84. high-level control fault model
85. high-level fault coverage
86. high-level fault model
87. high-level fault simulation
88. high-level functional fault model
89. Katun fault
90. low-level fault redundancy
91. no fault found
92. No-Fault-Found
93. open circuit fault
94. parallel fault-simulation
95. short circuit fault
96. stuck-at fault model
97. test generation and fault diagnosis
98. transient fault mitigation
99. transmission lines fault

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