Influence of second order lines on low accelerating voltage quantitative WDS analysis
author
statement of authorship
V. Mikli
source
EMAS 2005 : 9th European workshop on modern developments and applications in microbeam analysis : IUMAS-3 : 3rd meeting of the International Union of Microbeam Analysis Societies : 22-26 May 2005 in Convitto della Calza, Florence, Italy : book of abstracts : organised in collaboration with the Società Italiana di Scienze Microscopiche (SISM)
location of publication
[S.l.]
publisher
European Microbeam Analysis Society
year of publication
pages
p. 314
conference name, date
9th EMAS European Workshop on Modern Developments and Applications in Microbeam Analysis (EMAS 2005), May 22-26, 2005
conference location
Convitto della Calza, Florence, Italy
language
inglise
Mikli, V. Influence of second order lines on low accelerating voltage quantitative WDS analysis // EMAS 2005 : 9th European workshop on modern developments and applications in microbeam analysis : IUMAS-3 : 3rd meeting of the International Union of Microbeam Analysis Societies : 22-26 May 2005 in Convitto della Calza, Florence, Italy : book of abstracts : organised in collaboration with the Società Italiana di Scienze Microscopiche (SISM). [S.l.] : European Microbeam Analysis Society, 2005. p. 314.