Influence of second order lines on low accelerating voltage quantitative WDS analysis
autor
vastutusandmed
V. Mikli
allikas
EMAS 2005 : 9th European workshop on modern developments and applications in microbeam analysis : IUMAS-3 : 3rd meeting of the International Union of Microbeam Analysis Societies : 22-26 May 2005 in Convitto della Calza, Florence, Italy : book of abstracts : organised in collaboration with the Società Italiana di Scienze Microscopiche (SISM)
ilmumiskoht
[S.l.]
kirjastus/väljaandja
European Microbeam Analysis Society
ilmumisaasta
leheküljed
p. 314
konverentsi nimetus, aeg
9th EMAS European Workshop on Modern Developments and Applications in Microbeam Analysis (EMAS 2005), May 22-26, 2005
konverentsi toimumispaik
Convitto della Calza, Florence, Italy
keel
inglise
Mikli, V. Influence of second order lines on low accelerating voltage quantitative WDS analysis // EMAS 2005 : 9th European workshop on modern developments and applications in microbeam analysis : IUMAS-3 : 3rd meeting of the International Union of Microbeam Analysis Societies : 22-26 May 2005 in Convitto della Calza, Florence, Italy : book of abstracts : organised in collaboration with the Società Italiana di Scienze Microscopiche (SISM). [S.l.] : European Microbeam Analysis Society, 2005. p. 314.