Fast and efficient static compaction of test sequences based on greedy algorithms
author
Raik, Jaan
Jutman, Artur
Ubar, Raimund-Johannes
statement of authorship
J.Raik, A.Jutman, R.Ubar
source
IEEE Design and Diagnostics of Electronic Circuits and Systems - IEEE DDECS 2001 : Fourth International Workshop on IEEE Design and Diagnostics of Electronic Circuits and Systems : Györ, Hungary, April 18-20, 2001
location of publication
[S. l.]
year of publication
2001
pages
p. 117-122
url
https://slideplayer.com/slide/9971880/#google_vignette
subject term
testid
testimine
algoritmid
ISBN
963 7175 16 4
notes
Bibliogr.: 13 ref
language
inglise