Assembling low-level tests to high-level symbolic test frames
author
Jervan, Gert
Markus, Antti
Raik, Jaan
Ubar, Raimund-Johannes
statement of authorship
G.Jervan, A.Markus, J.Raik, R.Ubar
source
Proceedings [of the] 15th NORCHIP Conference, Tallinn, 10-11 November 1997
location of publication
[Copenhagen]
year of publication
1997
pages
p. 275-280: ill
subject term
testid
testimine
notes
Tiitellehel: ... 15th NORCHIP Seminar. Bibl. 6 ref
language
inglise