Diagnostic modeling of digital systems with multi-level decision diagrams
                                            statement of authorship
                                    
                                    
Raimund Ubar, Jaan Raik, Artur Jutman, Maksim Jenihhin
                                                    
                                            
                                            location of publication
                                    
                                    
Hershey
                                                    
                                            
                                            publisher
                                    
                                    
                                
                                            year of publication
                                    
                                    
                                
                                            pages
                                    
                                    
p. 92-118 : ill
                                                    
                                            
                                            ISBN
                                    
                                    
978-1-60960-212-3
                                                    
                                            
                                            notes
                                    
                                    
Bibliogr. p. 115-118
                                                    
                                            
                                            language
                                    
                                    
inglise
                                                    
                                            
                            Ubar, R., Raik, J., Jutman, A., Jenihhin, M. Diagnostic modeling of digital systems with multi-level decision diagrams // Design and test technology for dependable systems-on-chip. Hershey : Information Science Reference, 2011. p. 92-118 : ill.