Parallel critical path tracing fault simulation in sequential circuits
author
Kõusaar, Jaak
Ubar, Raimund-Johannes
Kostin, Sergei
Devadze, Sergei
Raik, Jaan
statement of authorship
Jaak Kõusaar, Raimund Ubar, Sergei Kostin, Sergei Devadze, Jaan Raik
source
Proceedings of 25th International Conference MIXED DESIGN OF INTEGRATED CIRCUITS AND SYSTEMS : MIXDES 2018 : Gdynia, Poland, June 21–23, 2018
location of publication
Lodz
publisher
Lodz University of Technology
year of publication
2018
pages
p. 305-310 : ill
conference name, date
25th International Conference Mixed Design of Integrated Circuits and System, MIXDES 2018, 21-23 June 2018
conference location
Gdynia, Poland
url
https://doi.org/10.23919/MIXDES.2018.8436880
subject term
testimine
rikked
kompuutersimulatsioon
subject of form
konverentsikogumikud
keyword
sequential circuits
stuck-at-faults
design for testability
fault simulation with critical path tracing
ISBN
978-83-63578-13-8
notes
Bibliogr.: 18 ref
TalTech department
arvutisüsteemide instituut
language
inglise
Reserch Group
Centre for trustworthy and efficient computing hardware (TECH)
Centre of dependable computing systems