Optimization of memory-constrained hybrid BIST for testing core-based systems
author
Jervan, Gert
Kruus, Helena
Orasson, Elmet
Ubar, Raimund-Johannes
statement of authorship
G.Jervan, H.Kruus, E.Orasson, R.Ubar
source
Proceedings of the IEEE 2nd International Symposium on Industrial Embedded Systems : SIES'2007 : Lisbon, Portugal, 4-6 July 2007
location of publication
[S.l.]
publisher
IEEE Computer Society
year of publication
2007
pages
p. 71-77
url
https://ieeexplore.ieee.org/document/4297319
subject term
testimine
digitaaltehnika
manussüsteemid
kiipvõrgud
rikked
language
inglise