Hierarchical test generation with multi-level decision diagram models
statement of authorship
Gert Jervan, Antti Markus, Jaan Raik, Raimund Ubar
source
Proceedings of the 7th IEEE North Atlantic Test Workshop, West Greenwich RI, USA, May 28-29, 1998
location of publication
[S.l.]
year of publication
pages
p. 26-33
subject term
language
inglise
Jervan, G., Markus, A., Raik, J., Ubar, R. Hierarchical test generation with multi-level decision diagram models // Proceedings of the 7th IEEE North Atlantic Test Workshop, West Greenwich RI, USA, May 28-29, 1998. [S.l.], 1998. p. 26-33.