Combining symbolic techniques with topological approach in test generation
author
Ubar, Raimund-Johannes
statement of authorship
R. Ubar
source
Proceedings of the 3rd Workshop on Mixed Design of Integrated Circuits and Systems, Lodz, May 1996
location of publication
[S.l.]
year of publication
1996
pages
p. 377-382
subject term
testimine
testid
integraallülitused
language
inglise