Testability guided hierarchical test generation with decision diagrams
author
Ubar, Raimund-Johannes
Raik, Jaan
Nõmmeots, Tanel
statement of authorship
R.Ubar, J.Raik, T.Nõmmeots
source
20th IEEE NORCHIP Conference : Copenhagen, Denmark, November 11-12, 2002
location of publication
Copenhagen
publisher
TechnoData
year of publication
2002
pages
p. 265-271