A global methodology for test program generation starting from high level specifications
author
Storojev, Sergei
Leveugle, Regis
Saucier, Gabriele
statement of authorship
Sergei Storojev, Regis Leveugle, Gabriele Saucier
source
BEC : Baltic Electronics Conference : proceedings of the 4th Biennial Conference, October 9-14, 1994, Tallinn (Estonia). 1
location of publication
Tallinn
year of publication
1994
pages
p. 305-311: ill
conference name, date
BEC : Baltic Electronics Conference, October 9-14, 1994,
conference location
Tallinn (Estonia)
url
https://www.ester.ee/record=b2150914*est
subject term
testimine
testid
raalprojekteerimine
integraallülitused
ISBN
9985-59-012-0
notes
Bibl. 4 ref
language
inglise