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Mapping physical defects to logic level for defect oriented testing

author
Ubar, Raimund-Johannes
statement of authorship
R. Ubar
source
SCS 2003 : International Symposium on Signals, Circuits and Systems : July 10-11, 2003, Iasi, Romania : proceedings. Vol. 2
location of publication
Piscataway
publisher
IEEE
year of publication
2003
pages
p. 453-456 : ill
conference name, date
SCS 2003, International Symposium on Signals, Circuits and Systems, July 10-11, 2003
conference location
Iasi, Romania
url
https://ieeexplore.ieee.org/document/5731320
subject term
testimine
defektid
ISBN
0-7803-7979-9
notes
Bibliogr.: 6 ref
language
inglise
Ubar, R.-J. Mapping physical defects to logic level for defect oriented testing // SCS 2003 : International Symposium on Signals, Circuits and Systems : July 10-11, 2003, Iasi, Romania : proceedings. Vol. 2. Piscataway : IEEE, 2003. p. 453-456 : ill. https://ieeexplore.ieee.org/document/5731320