On automatic software-based self-test program generation based on high-Level decision diagrams
author
Jasnetski, Artjom
Ubar, Raimund-Johannes
Tšertov, Anton
statement of authorship
Artjom Jasnetski, Raimund Ubar, Anton Tsertov
source
LATS 2016 : 17th IEEE Latin-American Test Symposium, Foz do Iguacu, Brazil, 6th-9th April 2016
location of publication
[S.l.]
publisher
IEEE
year of publication
2016
pages
p. 177
conference name, date
17th Latin-American Test Symposium, 6-9 April, 2016
conference location
Foz do Iguacu, Brazil
url
http://dx.doi.org/10.1109/LATW.2016.7483357
subject term
mikroprotsessorid
testimine
arvutiprogrammid
tarkvaraarendus
otsustusdiagrammid
keyword
microprocessor test
software-based self-test (SBST)
automatic test program generation
high-level decision diagrams
ISBN
978-1-5090-1331-9
notes
Bibliogr.: 3 ref
TalTech department
arvutitehnika instituut
language
inglise