Web-based framework for parallel distributed test [Electronic resource]
author
Ivask, Eero
Raik, Jaan
Ubar, Raimund-Johannes
statement of authorship
Eero Ivask, Jaan Raik, Raimund Ubar
source
2008 IEEE Design and Diagnostics of Electronic Circuits and Systems : Bratislava, Slovakia, April 16-18, 2008
location of publication
[S.l.]
publisher
IEEE
year of publication
2008
pages
p. 271-274 : ill. [CD-ROM]
ISBN
978-1-4244-2277-7
notes
Bibliogr.: 10 ref