Constraint-based test scenario description language

statement of authorship
J. Vain, E. Halling
location of publication
Tallinn
year of publication
pages
p. 89-92 : ill
conference name, date
13th Biennial Baltic Electronics Conference : October 3-5, 2012
conference location
Tallinn
ISSN
1736-3705
ISBN
978-1-4673-2772-5
notes
Bibliogr.: 8 ref
language
inglise