Conducted EMI emission evaluation considerations for test site and in-situ evaluation of DC microgrid supplied power converters
author
statement of authorship
Lauri Kütt, Kamran Daniel, Hetal Sharma, Martin Parker, Andrii Chub
location of publication
Tallinn
publisher
year of publication
pages
5 p
conference name, date
7th IEEE International Conference on DC Microgrids (ICDCM 2025), June 4 - 6, 2025
conference location
Tallinn, Estonia
ISBN
979-8-3315-1275-0
scientific publication
teaduspublikatsioon
TalTech department
language
Inglise
subject term
keyword
direct current microgrid
line impedance stabilization network
classifier
Kütt, L., Daniel, K., Sharma, H., Parker, M., Chub, A. Conducted EMI emission evaluation considerations for test site and in-situ evaluation of DC microgrid supplied power converters // 2025 IEEE Seventh International Conference on DC Microgrids (ICDCM). Tallinn : IEEE, 2025. 5 p. http://doi.org/10.1109/ICDCM63994.2025.11144729