print

Fast test cost calculation for hybrid BIST in digital systems

author
Orasson, Elmet
Raidma, Rein
Ubar, Raimund-Johannes
Jervan, Gert
Peng, Zebo
statement of authorship
Elmet Orasson, Rein Raidma, Raimund Ubar, Gert Jervan, Zebo Peng
source
Euromicro Symposium on Digital Systems Design : [Architectures, Methods and Tools : DSD 2001] : September 4-6, 2001, Warsaw, Poland : proceedings
location of publication
Los Alamitos
publisher
IEEE Computer Society
year of publication
2001
pages
p. 318-325 : ill
url
https://www.semanticscholar.org/paper/Fast-test-cost-calculation-for-hybrid-BIST-in-Orasson-Raidma/5aafcda5a18c2aabf0ad20cac10af10727f3c58f
subject term
integraallülitused
testimine
ISBN
0-7695-1239-0-9
notes
Bibliogr.: 12 ref
language
inglise
Orasson, E., Raidma, R., Ubar, R., Jervan, G., Peng, Z. Fast test cost calculation for hybrid BIST in digital systems // Euromicro Symposium on Digital Systems Design : [Architectures, Methods and Tools : DSD 2001] : September 4-6, 2001, Warsaw, Poland : proceedings. Los Alamitos : IEEE Computer Society, 2001. p. 318-325 : ill. https://www.semanticscholar.org/paper/Fast-test-cost-calculation-for-hybrid-BIST-in-Orasson-Raidma/5aafcda5a18c2aabf0ad20cac10af10727f3c58f