DefSim: a remote laboratory for studying physical defects in CMOS digital circuits
                                            author
                                    
                                    
                                            statement of authorship
                                    
                                    
Witold A.Pleskacz, Viera Stopjakova, Tomasz Borejko, Artur Jutman, and Andrzej Walkanis
                                                    
                                            
                                            journal volume number month
                                    
                                    
Vol. 55
                                                    
                                            
                                            year of publication
                                    
                                    
                                
                                            pages
                                    
                                    
6, p. 2405-2415 : ill
                                                    
                                            
                                            ISSN
                                    
                                    
0278-0046
                                                    
                                            
                                            notes
                                    
                                    
Bibliogr.: 26 ref
                                                    
                                            
                                            language
                                    
                                    
inglise
                                                    
                                            
                            Pleskacz, W.A., Stopjakova, V., Borejko, T., Jutman, A., Walkanis, A. DefSim: a remote laboratory for studying physical defects in CMOS digital circuits // IEEE transactions on industrial electronics (2008) Vol. 55, 6, p. 2405-2415 : ill.