Comparison of genetic and random techniques for test pattern generation
statement of authorship
E.Ivask, J.Raik, R.Ubar
location of publication
[Tallinn]
year of publication
pages
p. 163-166: ill
ISBN
9985-59-081-3
notes
Bibl. 8 ref
Ivask, E., Raik, J., Ubar, R. Comparison of genetic and random techniques for test pattern generation // BEC'98 : the 6th Biennial Conference on Electronics and Microsystems Technology, October 7-9, 1998, Tallinn, Estonia : proceedings. [Tallinn], 1998. p. 163-166: ill.