Multiple fault testing in systems-on-chip with high-level decision diagrams
statement of authorship
Raimund Ubar, Stephen Adeboye Oyeniran, Mario Schölzel, Heinrich T. Vierhaus
source
Proceedings of 2015 10th International Design & Test Symposium (IDT) : Dead Sea, Jordan, 14-16 December 2015
location of publication
Piscataway
publisher
year of publication
pages
p. 66-71 : ill
conference name, date
10th IEEE International Design & Test Symposium (IDT), 14-16 December, 2015
conference location
Dead Sea, Jordan
keyword
ISBN
978-1-4673-9993-4
notes
Bibliogr.: 17 ref
TTÜ department
language
inglise
Ubar, R., Oyeniran, S.A., Schölzel, M., Vierhaus, H.T. Multiple fault testing in systems-on-chip with high-level decision diagrams // Proceedings of 2015 10th International Design & Test Symposium (IDT) : Dead Sea, Jordan, 14-16 December 2015. Piscataway : IEEE, 2015. p. 66-71 : ill.