A synthesis-agnostic behavioral fault model for high gate-level fault coverage
author
Karputkin, Anton
Raik, Jaan
statement of authorship
Anton Karputkin, Jaan Raik
source
2016 Design, Automation & Test in Europe Conference & Exhibition (DATE) : proceedings
location of publication
[S.l.]
publisher
EDAA
year of publication
2016
pages
p. 1124-1127 : ill
conference name, date
2016 Design, Automation & Test in Europe Conference & Exhibition (DATE), 14-18 March, 2016
conference location
Dresden, Germany
url
https://ieeexplore.ieee.org/document/7459477/figures#figures
subject term
arvutisüsteemid
rikked
testimine
ISSN
1558-1101
ISBN
978-3-9815370-6-2
notes
Bibliogr.: 19 ref
TalTech department
arvutitehnika instituut
language
inglise