Representing gate-level SET faults by multiple SEU faults on RT-level
author
Bagbaba, Ahmet Cagri
Jenihhin, Maksim
Ubar, Raimund-Johannes
Sauer, Christian
statement of authorship
Ahmet Cagri Bagbaba, Maksim Jenihhin, Raimund Ubar, Christian Sauer
source
2020 IEEE 26th International Symposium on On-Line Testing and Robust System Design (IOLTS), 13-15 July 2020 : proceedings
location of publication
Danvers
publisher
IEEE
year of publication
2020
pages
art. 19889351, 6 p. : ill
conference name, date
IEEE 26th International Symposium on On-Line Testing and Robust System Design (IOLTS), 13-15 July 2020
conference location
Napoli, Italy
url
https://doi.org/10.1109/IOLTS50870.2020.9159715
subject term
vead
veakindlus
tarkvara
keyword
SET
SEU
multiple faults
functional safety
hardware security
fault injection
ISBN
9781728181875
notes
Bibliogr.: 20 ref
scientific publication
teaduspublikatsioon
classifier
3.1
TalTech department
arvutisüsteemide instituut
language
inglise
Reserch Group
Centre for trustworthy and efficient computing hardware (TECH)
Centre of dependable computing systems