Calculation of probabilistic testability measures for digital circuits with Structurally Synthesized BDDs
author
Jürimägi, Lembit
Ubar, Raimund-Johannes
Jenihhin, Maksim
Raik, Jaan
statement of authorship
Lembit Jürimägi, Raimund Ubar, Maksim Jenihhin, Jaan Raik
source
Microprocessors and microsystems
publisher
Elsevier
journal volume number month
vol. 77
year of publication
2020
pages
art. 103117, 12 p
url
https://doi.org/10.1016/j.micpro.2020.103117
subject term
digitaaltehnika
diagnostika (tehnika)
rikked
testimine
elektronlülitused
keyword
combinational circuits
signal probabilities
testability
fault redundancy
structurally synthesized BDDs
ISSN
0141-9331
notes
Bibliogr.: 43 ref
scientific publication
teaduspublikatsioon
classifier
1.1
Scopus
https://www.scopus.com/sourceid/15552
https://www.scopus.com/record/display.uri?eid=2-s2.0-85086377299&origin=inward&txGid=f742e708555546cb12b9117a6e274d64
WOS
https://jcr.clarivate.com/jcr-jp/journal-profile?journal=MICROPROCESS%20MICROSY&year=2022
https://www.webofscience.com/wos/woscc/full-record/WOS:000571530400009
category (general)
Computer science
Arvutiteadus
category (sub)
Computer science. Computer networks and communications
Arvutiteadus. Arvutivõrgud ja side
Computer science. Hardware and architecture
Arvutiteadus. Riistvara ja arhitektuur
Computer science. Software
Arvutiteadus. Tarkvara
Computer science. Artificial intelligence
Arvutiteadus. Tehisintellekt
quartile
Q2
TalTech department
arvutisüsteemide instituut
language
inglise
Reserch Group
Centre for trustworthy and efficient computing hardware (TECH)
Centre of dependable computing systems