Hierarchical test generation for digital systems
author
Brik, Marina
Jervan, Gert
Markus, Antti
Raik, Jaan
Ubar, Raimund-Johannes
statement of authorship
Marina Brik, Gert Jervan, Antti Markus, Jaan Raik and Raimund Ubar
source
Mixed design of integrated circuits and systems
location of publication
Boston
publisher
Kluwer Academic Publishers
year of publication
1998
pages
p. 131-136: ill
url
https://link.springer.com/chapter/10.1007/978-1-4615-5651-0_20
subject term
digitaaltehnika
testimine
graafid
mudelid
ISBN
0-7923-8116-5
notes
Bibl. 15 ref
language
inglise