Hierarchical test generation for digital systems based on combining bottom-up and top-down approaches
author
Raik, Jaan
Ubar, Raimund-Johannes
statement of authorship
J. Raik, R. Ubar
source
World Multiconference on Systemics, Cybernetics and Informatics, July 12-16, 1998, Orlando, Florida : proceedings. Vol. 1
location of publication
[S.l.]
year of publication
1998
pages
p. 374-381: ill
subject term
digitaaltehnika
testimine
ISBN
980-07-5078-9
notes
Bibl. 27 ref
language
inglise