Re-using chip level DFT at board level
author
Gu, Xinli
Jutman, Artur
statement of authorship
Xinli GU, ... Artur Jutman, ... [et al.]
source
Proceedings : 2012 17th IEEE European Test Symposium (ETS) : May 28th–June 1st, 2012, Annecy, France
location of publication
Los Alimitos
publisher
IEEE Computer Society
year of publication
2012
pages
1 p
conference name, date
2012 17th IEEE European Test Symposium (ETS),May 28th–June 1st, 2012
conference location
Annecy, France
url
https://www.academia.edu/25351525/Re_using_chip_level_DFT_at_board_level
subject term
integraallülitused
testimine
diagnostika (tehnika)
keyword
board test
board diagnosis
chip access
IEEE P1687
IEEE 1149.1
ISBN
978-1-4673-0697-3
language
inglise