Fast static compaction of tests composed of independent sequences : basic properties and comparison of methods
author
Raik, Jaan
Jutman, Artur
Ubar, Raimund-Johannes
statement of authorship
Jaan Raik, Artur Jutman, Raimund Ubar
source
The 9th IEEE International Conference on Electronics, Circuits and Systems : ICECS 2002 : September 15-18, 2002, Dubrovnik, Croatia. Volume II
location of publication
Piscataway
publisher
IEEE
year of publication
2002
pages
p. 445-448 : ill
conference name, date
9th IEEE International Conference on Electronics, Circuits and Systems, ICECS 2002, September 15-18, 2002
conference location
Dubrovnik, Croatia
url
http://dx.doi.org/10.1109/ICECS.2002.1046190
https://ieeexplore.ieee.org/document/1046190
subject term
elektriahelad
testimine
ISBN
0-7803-7596-3
notes
Bibliogr.: 7 ref
TTÜ department
arvutitehnika instituut
language
inglise