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Numerical simulation of electrothermal effects in ESD protection devices

author
Hellstrom, S.
Freidin, Boris
Velmre, Enn
Udal, Andres
statement of authorship
Hellstrom, S., Freydin, B., Velmre, E., Udal, A.
source
Techn. Dig. of the 3rd European Symposium on Reliability of Electron Devices, Failure Physics and Analysis, 1992, Oct. 5-8, Schwäbisch Gmünd, Germany
location of publication
Berlin
publisher
VDE-Verlag
year of publication
1992
pages
p. 77-80
url
https://d-nb.info/921228503/04
subject term
elektroonikaaparatuur
hõõrdeelekter
varjestus
lülitus- ja kaitseseadised
simulatsioon
matemaatiline modelleerimine
TalTech department
elektroonikainstituut
language
inglise
Hellstrom, S., Freydin, B., Velmre, E., Udal, A. Numerical simulation of electrothermal effects in ESD protection devices // Techn. Dig. of the 3rd European Symposium on Reliability of Electron Devices, Failure Physics and Analysis, 1992, Oct. 5-8, Schwäbisch Gmünd, Germany. Berlin : VDE-Verlag, 1992. p. 77-80. https://d-nb.info/921228503/04