The measurement and tuning of SiC diode voltage doubler represented as diffusion-welded stack [Online resource]
statement of authorship
Jana Toompuu, Natalja Sleptsuk, Raul Land, Oleg Korolkov, Toomas Rang
publisher
year of publication
pages
4 p.: ill
conference name, date
16th Biennial Baltic Electronics Conference (BEC), October 8-10, 2018
conference location
Tallinn, Estonia
subject term
keyword
silicon carbide JBS diodes
ISSN
1736-3705
ISBN
978-1-5386-7313-3
notes
Bibliogr.: 4 ref
TTÜ department
language
inglise
Toompuu, J., Sleptšuk, N., Land, R., Korolkov, O., Rang, T. The measurement and tuning of SiC diode voltage doubler represented as diffusion-welded stack [Online resource] // BEC 2018 : 2018 16th Biennial Baltic Electronics Conference (BEC) : proceedings of the 16th Biennial Baltic Electronics Conference, October 8-10, 2018. : IEEE, 2018. 4 p.: ill.