New built-in self-test scheme for SoC interconnect
statement of authorship
Artur Jutman, Raimund Ubar, and Jaan Raik
source
The 9th World Multi-Conference on Systemics, Cybernetics and Informatics : WMSCI 2005 : July 10-13, 2005, Orlando, Florida, USA. Vol. IV
location of publication
[Orlando]
year of publication
pages
p. 19-24 : ill
ISBN
980-6560-56-6
notes
Bibliogr.: 26 ref
TalTech department
language
inglise
Jutman, A., Ubar, R.-J., Raik, J. New built-in self-test scheme for SoC interconnect // The 9th World Multi-Conference on Systemics, Cybernetics and Informatics : WMSCI 2005 : July 10-13, 2005, Orlando, Florida, USA. Vol. IV. [Orlando] : International Institute of Informatics and Systemics, 2005. p. 19-24 : ill.