Understanding multidimensional verification : where functional meets non-functional
author
statement of authorship
Xinhui Lai, Aneesh Balakrishnan, Thomas Lange, Maksim Jenihhin, Tara Ghasempouri, Jaan Raik, Dan Alexandrescu
publisher
journal volume number month
vol. 71
year of publication
pages
art. 102867, 13 p. : ill
ISSN
0141-9331
notes
Bibliogr.: 86 ref
Open Access
Open Access
scientific publication
teaduspublikatsioon
language
inglise
classifier
kvartiil
TTÜ department
- A synthetic, hierarchical approach for modelling and managing complex systems' quality and reliability = Sünteetiline, hierarhiline lähenemine keerukate süsteemide kvaliteedi ja töökindluse modelleerimiseks ja haldamiseks
- Approaches to extra-functional verification of security and reliability aspects in hardware designs = Riistvaraprojektide turva- ja töökindlusaspektide ekstrafunktsionaalse verifitseerimise lähenemisviisid
Lai, X., Balakrishnan, A., Lange, T., Jenihhin, M., Ghasempouri, T., Raik, J., Alexandrescu, D. Understanding multidimensional verification : where functional meets non-functional // Microprocessors and microsystems (2019) vol. 71, art. 102867, 13 p. : ill. https://doi.org/10.1016/j.micpro.2019.102867