Off-line testing of crosstalk induced glitch faults in NoC Interconnects
author
Bengtsson, Tomas
Kumar, Shashi
Jutman, Artur
Ubar, Raimund-Johannes
statement of authorship
Tomas Bengtsson, Shashi Kumar, Raimund Ubar, Artur Jutman
source
Proceedings [of] 24th IEEE Norchip Conference : Linköping, Sweden, 20-21 November 2006
location of publication
[S.l.]
publisher
IEEE
year of publication
2006
pages
p. 221-225 : ill
conference name, date
24th IEEE Norchip Conference, 20-21 November, 2006
conference location
Linköping, Sweden
url
http://dx.doi.org/10.1109/NORCHP.2006.329215
subject term
integraallülitused
rikked
testimine
ISBN
1-4244-0772-9
notes
Bibliogr.: 9 ref
TalTech department
arvutitehnika instituut
language
inglise