SiC-diodes forward surge current failure mechanisms : experiment and simulation
author
statement of authorship
A.Udal and E.Velmre
source
publisher
journal volume number month
Vol. 37, 10/11
year of publication
pages
p. 1671-1674
ISSN
0026-2714
Open Access
Open Access
language
inglise
subject term
TalTech department
Udal, A., Velmre, E. SiC-diodes forward surge current failure mechanisms : experiment and simulation // Microelectronics reliability (1997) Vol. 37, 10/11, p. 1671-1674. https://doi.org/10.1016/S0026-2714(97)00136-4