10th IEEE European Test Symposium
variant title
10th IEEE European Test Symposium
statement of authorship
Raimund Ubar, Paolo Prinetto, Jaan Raik
journal volume number month
Vol. 22, 5
year of publication
pages
p. 480-481 : phot
conference name, date
10th IEEE European Test Symposium, 22-25 May, 2005
conference location
Tallinn, Estonia
ISSN
0740-7475
TTÜ department
language
inglise
Ubar, R.-J., Prinetto, P., Raik, J. 10th IEEE European Test Symposium // IEEE journal of design & test of computers (2005) Vol. 22, 5, p. 480-481 : phot.