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static timing analysis (keyword)
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1
book article
Gate-level modelling of NBTI-induced delays under process variations
Copetti, Thiago
;
Cardoso Medeiros, Guilherme
;
Bolzani Poehls, Leticia
;
Vargas, Fabian
;
Kostin, Sergei
;
Jenihhin, Maksim
;
Raik, Jaan
;
Ubar, Raimund-Johannes
LATS 2016 : 17th IEEE Latin-American Test Symposium, Foz do Iguacu, Brazil, 6th-9th April 2016
2016
/
p. 75-80 : ill
http://dx.doi.org/10.1109/LATW.2016.7483343
book article
2
book article
Hierarchical identification of NBTI-critical gates in nanoscale logic
Kostin, Sergei
;
Raik, Jaan
;
Ubar, Raimund-Johannes
;
Jenihhin, Maksim
LATW2014 : 15th IEEE Latin-American Test Workshop : Fortaleza, Brazil, March 12th-15th, 2014
2014
/
[6] p. : ill
book article
3
book article
SPICE-inspired fast gate-level computation of NBTI-induced delays in nanoscale logic
Kostin, Sergei
;
Raik, Jaan
;
Ubar, Raimund-Johannes
;
Jenihhin, Maksim
2015 IEEE 18th International Symposium on Design and Diagnostics of Electronic Circuits & Systems DDECS 2015 : 22-24 April 2015, Belgrade, Serbia : proceedings
2015
/
p. 223-228 : ill
book article
Number of records 3, displaying
1 - 3
keyword
29
1.
static timing analysis
2.
hierarchical timing analysis
3.
timing analysis
4.
quasi-static analysis
5.
static analysis
6.
disclosure timing
7.
timing
8.
timing circuits
9.
timing verification
10.
timing-critical path
11.
timing-critical paths
12.
quasi static
13.
quasi-static
14.
quasi-static and dynamic collision simulations
15.
quasi-static channel
16.
quasi-static loading
17.
quasi-static Maxwell’s equations
18.
quasi-static structural response
19.
simulation based static optimization
20.
static heat flows
21.
static load models
22.
static load test
23.
static magnetic field
24.
static measurement feedback
25.
static posture
26.
static power converters
27.
static shading
28.
static VAR compensators
29.
static-dynamic probing test (SDT)
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